"A Practical Guide to Scanning Probe Microscopy"

Introduction

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Chapter 1 SPM Techniques

1.2 Atomic Force Microscopy

1.2.1 Contact AFM

1.2.2 Non-contact AFM

1.2.3 Intermittent-contact AFM

1.4 Lateral Force Microscopy

1.5 Other SPM Techniques

1.5.1 Force Modulation Microscopy

1.5.2 Phase Detection Microscopy

1.5.3 Electrostatic Force Microscopy

1.5.4 Scanning Capacitance Microscopy

1.5.5 Thermal Scanning Microscopy

1.5.6 Near-field Scanning Optical Microscopy

1.5.7 Nanolithography

1.6 SPMs as Surface Analysis Tools

1.6.1 Scanning Tunneling Spectroscopy

1.6.2 Force vs. Distance Curves

1.7 SPM Environments

1.7.1 Ultra-high Vacuum

1.7.2 Ambient

1.7.3 Liquid

1.7.4 Electrochemical

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Chapter 2 The Scanner

2.2 Scanner Nonlinearities

2.2.1 Intrinsic Nonlinearity

2.2.2 Hysteresis

2.2.3 Creep

2.2.4 Aging

2.2.5 Cross Coupling

2.4 Hardware Correction

2.4.1 Optical Techniques

2.4.2 Capacitive Techniques

2.4.3 Strain-gauge Techniques

2.5 Tests for Scanner Linearity

2.5.1 Intrinsic Nonlinearity

2.5.2 Hysteresis

2.5.3 Creep

2.5.4 Aging

2.5.5 Cross Coupling

2.5.6 Step Profile: Hysteresis, Creep, and Cross Coupling in Z

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Chapter 3 Cantilevers and Tips

3.2 How to Select a Cantilever

3.3 Tip Shape and Resolution

3.4 Further Reading

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Chapter 4 Image Artifacts

4.1 Tip Convolution

4.2 Convolution with Other Physics

4.3 Feedback Artifacts

4.4 Image Processing Artifacts

4.5 Test for Artifacts

4.6 Further Reading

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Chapter 5 Key Features of SPMs

5.2 Optical Microscope

5.3 Probe Handling

5.4 System Accessibility

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Credits

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